Metrology and Measurement Systems
Metrology and Measurement Systems > 2013 > Vol. 20, nr 3 > 371--384
Metrology and Measurement Systems > 2013 > Vol. 20, nr 3 > 443--452
Metrology and Measurement Systems > 2013 > Vol. 20, nr 3 > 359--370
Metrology and Measurement Systems > 2013 > Vol. 20, nr 3 > 431--442
Metrology and Measurement Systems > 2013 > Vol. 20, nr 3 > 501--512
Metrology and Measurement Systems > 2013 > Vol. 20, nr 3 > 351--358
Metrology and Measurement Systems > 2013 > Vol. 20, nr 3 > 491--500
Metrology and Measurement Systems > 2013 > Vol. 20, nr 3 > 479--490
Metrology and Measurement Systems > 2013 > Vol. 20, nr 3 > 327--336
Metrology and Measurement Systems > 2013 > Vol. 20, nr 3 > 513--524
Metrology and Measurement Systems > 2013 > Vol. 20, nr 3 > 465--478
Metrology and Measurement Systems > 2013 > Vol. 20, nr 3 > 407--418
Metrology and Measurement Systems > 2013 > Vol. 20, nr 3 > 385--394
Metrology and Measurement Systems > 2013 > Vol. 20, nr 3 > 337--350
Metrology and Measurement Systems > 2013 > Vol. 20, nr 3 > 453--464
Metrology and Measurement Systems > 2013 > Vol. 20, nr 3 > 395--406
Metrology and Measurement Systems > 2013 > Vol. 20, nr 3 > 419--430